LCD_MV

LCD_MV

   
SYNTAX:

        LCD_MV(PINS [, UP_LIMIT=x] [, DOWN_LIMIT=x] [, MEAS_LOOP=x] [, AVG or MAX or MIN or MAVG or RAM] [, RESULT=name] [, PIN_INC/STEP_INC] [, LOG_OFF] [, BinNo=x] [, LOG_ALIAS=name] [, LOG_UNIT=unit] [, USER_MONITOR] [, IGNORE_FAIL] [,MEASURE_LOOP_INTERVAL=x] [,RESULT=x]);

DESCRIPTION:

         Read back the resource measure value that connect to ADC in tester. LCD_MV including the measure of result and check the pass range for this result. 

REQUIRED ARGUMENT:

         PARA1: PINS

            PIN_GROUP_NAME or PIN_NAME

OPTIONAL ARGUMENT:  

        PARA: UP_LIMIT=x

            x : a voltage value, unit: V, mV or parameter name or GB1~64/MEASURE_VALUE/PinName variable or _C_Variable(double).

        PARA: DOWN_LIMIT=x

            x : a voltage value, unit: V, mV or parameter name or GB1~64/MEASURE_VALUE/PinName variable or C  variable(double).  

        PARA: MEAS_LOOP=x

            Measure for x times to get the Average, Minimum, Maximum value. 

            Range:64K - or _C_Variable

            Default: 1  

PARA: AVG or MAX or MIN or MAVG

            AVG/MAX/MIN/MAVG

            AVG: Use the Average value to compare limit.

            MAX: Use the Maximum value to compare limit.

            MIN: Use the Minimum value to compare limit.

            MAVG: get all measure values, ranking, then remove least 25% and largest 25% of measure values, average middle 50% of measure values. In this mode MEAS_LOOP range in 3~30000,and take longer measure time 

            Default: AVG.

        PARA: RESULT=name

            RESULT: array name 

            System buffer name and file name saved the log data. Log data also saved in global array Sys_SW_BUFFER_DATA[][].

            If there are more than two "LCD_MV" driver in a prg file, it must set in different name to avoid system conflict. 

        PARA: PIN_INC/STEP_INC

            Set the data mode.

PARA: LOG_OFF

            Set measured value not log to datalog windows, even it is set to be on in engineering set.

            Default: Depend on engineering setting.

PARA: BinNo=x

            x: a integer from 1 to 2048; While test result is fail at this driver, system classify the device to bin x.

        PARA: LOG_ALIAS=name

            name: a string; EX: LOG_ALIAS=ABC. The setting name will show in the .csv file and user monitor.

        PARA: LOG_UNIT=unit

            unit: a string; EX: V, mV ......., This setting will show after the alias name.

            Parameter can be set to LOG_UNIT=unit[.X] , this function can set the significant digits of fractional portion which will be shown in the .csv file.

            X: The number of significant digits of fractional portion.

        PARA: USER_MONITOR

            USER_MONITOR: Log measured value to user monitor.

            USER_MON_ONLY: Only show measured value in monitor without producing C.S.V file and STDF file.

        PARA: IGNORE_FAIL 

            This argument is identical to the function "Dc Ignore Fail=On" on engineer setting menu. It ignore the measure result, and go to next driver.

            Default: OFF.

        PARA: MEASURE_LOOP_INTERVAL=x

            sampling time between each measure execution in measure loop

            Range:6uS-106uS

            default: 6uS

         PARA: RESULT=name

            RESULT: array name 

            Array saved the log data.

        

EXAMPLE:

          ARRAY AAAAA(800*2);

          LCD_SET_ADC_SWITCH_TABLE(LCDPIN);

          LCD_SET_SWITCH(ADC=ON, RVS=OFF, ACTIVE_LOAD=OFF,WAIT=0mS);

          WAIT(3mS);

          LCD_MV(LCDPIN,RESULT=AAAAA);

          for(int site=0;site            for(int i=0;i              GBX[i+1024*site]=AAAAA[i+800*site];    

            }    

          }

          

          C_COMPARE(GBX1     , UP_LIMIT=-3, DOWN_LIMIT=-4); 

          C_COMPARE(GBX500  , UP_LIMIT=-3, DOWN_LIMIT=-4);

          C_COMPARE(GBX800  , UP_LIMIT=-3, DOWN_LIMIT=-4);